Purpose of the development: NANOEDUCATOR - it's Scientific and Academic Complex, designed to teach the basics of nanotechnology in institutes and universities.

Recommended application field: The use of basic SPM techniques: - AFM, "Semi-contact" method                    Displaying relief                    The mapping of the differential contrast                    The mapping phase contrast                    force spectroscopy                    Dynamic force lithography   - STM                   Displaying relief                   Displays current (method of constant height)                   V (Z) spectroscopy                   I (V) spectroscopy                  The presence of AFM and STM techniques allows the study as conductive and dielectric samples. As examples can be cited: Biological objects, down to DNA Storage media (CD, DVD and die for their manufacture) Micro-and Nanostructures Optoelectronic components, etc.

Technical characteristic: Scanning System   - Scanning of samples   - Measuring range of linear dimensions   in the plane XY, not less than 100 microns   - Measuring range of linear dimensions   axis Z, at least 10 microns   - Step by step scanning (step Min.) 2 A   - The standard deviation (SD) of the results of measurements of linear dimensions in the XY plane is not more than 5%   - The standard deviation (SD) of the results of measurements of linear dimensions along the Z axis is not more than 5%   Resolution   - Resolution of the XY plane of less than 50 nm   - Resolution of the Z axis is not more than 2 nm   - Maximum number of scan points X and Y 1024x1024   - Scanning linearity in the XY plane is not more than 30 nm   - Neortogonalnast scanner in the XY plane is not more than 5 °   - Scanning flatness in the XY plane is not more than 500 nm   - Drift in the XY plane is not more than 5 A / c   - Drift Z axis is not more than 5 A / c   - AFM mode X_Y - 50 nm up to 10 nm using a sharp needle and vibration Z - 3 nm   - STM mode X_Y - 10 nm, Z - 3 nm Operating system Mac OS and Windows XP Sample   -Sample size diameter up to 12 mm   -The sample thickness up to 5 mm   -Ability to apply a voltage to the sample is Weight and dimensions   - Dimensions of the controller   (Length x depth x height) mm 260x160x360   - Dimensions of the measuring head   (Length x depth x height) mm 160x160x130   - Weight (included) not more than 8 kg Operating conditions   - Power supply voltage AC 220 (+10 / -15%) in   - Power consumption 60 W   - Temeperatura ambient temperature of 20 ± 5 ° C   - Relative humidity less than 65 ± 15%   - Atmospheric pressure 760 ± 30 mm Hg   - Temperature drift no more than 1 ° C per hour   - The amplitude of vibration in the frequency 11000 Hz is not more than 0.5 microns

Advantages over analogues: user-friendly interface Guided Setup SPM techniques Visibility, animation training The absence of complex settings A simple change of the sample The ability to recover the probe and affordable supplies

The development stage readiness: Ready for application

Description of the development:
()
NANOEDUCATOR - special equipment for teaching the fundamentals of nanotechnology. An integrated approach to learning is ensured by the following components: Basic scanning probe microscope NANOEDUCATOR A tutorial on the basics of SPM spectroscopy and nanolithography Detailed User Guide The presence of a virtual Demo-version of the program, conducting user through all of the steps of providing a quality SPM images Developed by Context Help The collection of FAQ (Frequently Asked Questions) Approved laboratory training with a set of training samples for research. The educational process using NANOEDUCATOR aims to develop the basic operation modes in Scanning Probe Microscopy, the acquisition of research skills of nano-objects and nanostructures, conducting probe nanolithography and nanomanipulation. The measuring system has a special design, which takes into account the need to protect against accidental damage, built-in digital camera allows you to select an interesting area on the surface of the sample and monitor the status and progress of the probe inlet to the surface. Special the probe may be reduced by etching, thereby reducing maintenance costs and allows to acquire additional skills of the user. NANOEDUCATOR is a complete SPM specifically designed to teach basic techniques of SPM. The instrument allows the AFM and STM measurements without changing the probe. The measuring head includes a scanner with the stage on which the specimen and the probe. Construction measuring head is designed so as to avoid accidental damage to a transverse displacement of the scanner. Easily installed on the measuring head is equipped with a self-contained digital video camera light source. The possibility of moving the camcorder allows you to select area of ??interest on the sample surface. The position of the light source may also be changed, allowing you to emphasize the features of the terrain surface of the sample by varying the angle of illumination The probe Universal probe sensor is resettable - when worn or damaged probe tip, which is made from tungsten wire, it can be re-sharpened by etching. Etching device To restore probes a special device etching (UTI), which allows the electrochemical etching method to obtain probes with a radius of curvature of the point at 0.2 microns. The new user-friendly software educational and scientific complex is compatible with the operating systems MAC OS ® and Windows XP ®. Thus, the installation of educational and scientific complex NANOEDUCATOR actually means getting a "turnkey" training class on nanotechnology, in which you can immediately begin the process of learning.

corresponds technical description
Ready for implementation

Possibility of transfer abroad:
Licence's sale
Combinated reduction to industrial level
Realization of finished commodity
Joint production, sale, exploitation

Photo

Country Russia

For additional information turn to:
E-mail: gal@uintei.kiev.ua