Purpose of the development: A device for determining the quality of the optical semiconductor materials by measuring the distribution of impurities in them after the growth of single crystals. The methods of control crystals transparent in the infrared range using: - The polarization effect (patents of Ukraine for utility models N: 37 067 and N: 39 789 ); - Thermal control (patent of Ukraine for useful model N: 16797 / 1); - Effect of scattering on structural defects. The developed methods have the speed, which makes it possible to use them in production.

Recommended application field: Materials Engineering, inspection, infrared instrument making

Technical characteristic: Spectral measurements of the optical transmission range: 4-16 microns Accuracy: 0.3% The scan time of one point: 50 seconds. PC Connectivity: USB Control methods being tested in the company of "Tehnokristall."

The development stage readiness: Tested experimental exploitation order

Possibility of transfer abroad:
Licence's sale

Photo

Country Ukraine

For additional information turn to:
E-mail: gal@uintei.kiev.ua