Purpose of the development: The sensor is designed for astrophysical and medical research, and can be used for registration of optical and X-ray images in the medical devices and observatories. The sensor is based on a semiconductor barrier structures using materials with significant breach of long-range order, possibly schematic scan sensor, which gives a hard raster Image and facilitates entry of information into the computer for further processing.

Recommended application field: The implementation of - science, technology, enterprises of various industries. Create a working laboratory samples tested.

Technical characteristic: Main technical characteristics: --- Size photosensitive surface, 5x5 cm * --- Spectral sensitivity region, nm 450 - 800 --- The maximum sensitivity, lux 10 [-6] --- Signal accumulation time at 300 K up to 24 hours --- Internal gain factor. not less than 10 [2] --- Distribution capacity, 5 micron

Advantages over analogues: Taken together, these characteristics of the sensor (including the scanning device of the converter, for which you have the copyright certificate) is unique among domestic and foreign technology and allows use design to address fundamental and applied problems of astrophysics, as well as in various practice areas of medicine (for rapid X-ray imaging with subsequent processing, eg, computed tomography). Certificate of Authorship № 1454177 "semiconductor image converter." Technical and economic characteristics of the sensor make it competitive in the world market.

The development stage readiness: Tested experimental exploitation order

Technical and economic effect: Sensor for use in the practice of medical radiographic studies eliminates the use of X-ray photographs of securities, which may provide a significant economic benefit.

Information about newness of the development:
there are inventor's certificate -- 1 items

corresponds technical description
Ready for implementation

Possibility of transfer abroad:
Licence's sale
Licence's sale
Technological document's sale
Combinated reduction to industrial level

Photo

Country Ukraine

For additional information turn to:
E-mail: gal@uintei.kiev.ua