Purpose of the development: Professional universal scanning probe microscope for scanning the samples at the atomic level and allows you to get complete and accurate information about their properties: the topography, the separation of the magnetic and electric fields, local stiffness and elasticity (including quantification of the Young's modulus), toughness, strength, friction, adhesion etc.

Recommended application field: Nanoelectronics. Suitable polymeric materials for the study (spherulites and dendrites, single crystals of the polymer, block copolymers, polymer nanoparticles, LB film, thin film).

Technical characteristic: The structure of this model also includes a set of probe sensors, test and calibration structures are specially designed for specific applications specific configuration. The presence of fluid head allows measurements in the field of Life Sciences. Possible study of various materials with heating at 130 * C.

Advantages over analogues: The modular design provides a unique opportunity to configure the device for specific applications and specific research techniques. Measurement range can vary from 1.3 to 15 microns in Z, and from 3 to 150 microns in XY. The high degree of approval from the molecular to the atomic level in the contact mode AFM and STM is achieved through the use of scanners with ranges: 3h3h1, 3 micron and micron 10x10x2.

The development stage readiness: Ready for application

Description of the development:
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The ability to scan at the atomic level provides low noise of the scanner (0.25A RMS on Z) and extremely small step size scan (using a 22-bit ADC). The control electronics of new generation allows you to work in high-frequency modes (up to 5 MHz). This feature is important when working with the high frequency modes atomic force microscope or by using high frequency cantilevers. Measuring method: On the air: - STM - ACM (+ contact + semi-contact) - Display of the phase - Modulation of force - Display the spreading resistance - Display of the adhesion forces - AFM force lithography - Current AFM lithography - STM lithography In the liquid: - ACM (+ contact + semi-contact) - Display of the phase - Modulation of force - Microscopy of adhesion forces - ASM Lithography

corresponds technical description
Ready for implementation

Possibility of transfer abroad:
Licence's sale
Licence's sale
Technological document's sale
Creation of joint enterprise
Realization of finished commodity

Photo

Country Ukraine

For additional information turn to:
E-mail: gal@uintei.kiev.ua