Purpose of the development: The microscope is designed for non-destructive quality control mikrosvarnyh compounds in silicon chips.

Recommended application field: Application: - Non-destructive quality control mikrosvarnyh compounds; - The quality of mechanical contact.

Technical characteristic: Main technical characteristics: Scanning field from 50x50 mm to 500x500 mm Modulation frequency range 150 - 1500 Hz Resolution of 5 - 7 mm While scanning the total field of 100 - 500

The development stage readiness: Ready for application

Technical and economic effect: Implementation: microscope was ordered by the NGO "microdevice".

Description of the development:
()
Of FA microscope: 1 - continuous wave laser, 2 - modulator, 3 - scanner 4 - lens, 5 - sample 6 - piezoceramics, 7 - amp; 8 - computer.

corresponds technical description
Ready for implementation

Possibility of transfer abroad:
Licence's sale
Licence's sale
Technological document's sale
Creation of joint enterprise

Photo

Country Ukraine

For additional information turn to:
E-mail: gal@uintei.kiev.ua