Purpose of the development: To carry out technical inspection of linear analogue and digital devices using a diagnostic parameter and a minimum number of dots with high reliability allowable time.

Recommended application field: The facts and theoretical conclusions of this study can be used in the further development of new and existing systems, built-in monitoring the technical condition of electronic devices for various purposes in the interest of the Ministry of Defence of Ukraine, the Ministry of Emergency Situations, Ministry of Internal Affairs, the Security Service of Ukraine and other ministries and departments.

Technical characteristic: 1. Between the signal parameters of the outputs and control point linear analog or digital device, there is a strong correlation. The correlation coefficient rxy = 0,95. 2. A defect in the device causes a change in the values of the parameters of the signal at its output and at the check point, that is the condition of existence of a defect in the transport and check point. 3. Control the resistance should not significantly affect the operation of the device. This requires that: - controlling the resistance value does not exceed the value of the dynamic resistance of the device by more than 10%. - the ratio of signal to noise levels at the reference point is at least 5.

Advantages over analogues: 1. Fast localization disabled analog and digital devices. 2. Reduce mean time to repair and increase the coefficient of readiness of objects of radio electronic technology (RET). 3. Reducing recovery facilities of the RET jewelry. Existing methods provide for the development of inspection tests, analysis of initial reactions to the device outputs. In this case, the length of these tests increases sharply with a slight increase in the reliability of the technical state of the control is not always justified for the modern element base, which includes integrated circuits, ultra-high integration.

The development stage readiness: Ready for application

Description of the development:
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The main result: A device monitoring the technical condition of the analog and digital devices, which are static energy realizirovan method of monitoring the technical condition of line-level analog and digital devices. Materials research in readiness at 60% for the introduction. Summary - static energy method is that the diagnostic parameter is used as a voltage value, which is measured on the additional linear resistance of analog and digital devices, and experimentally found that by changing the conditions of its existence and transportation to the point of any defect. Using the calculation results can improve the accuracy of decision-making about the technical condition of these devices in a reasonable time.

corresponds technical description
Guarantees stable results getting

Possibility of transfer abroad:
Realization of finished commodity

Photo

Country Ukraine

For additional information turn to:
E-mail: gal@uintei.kiev.ua